Vacuum chamber with two-stage longitudinal translation for circuit board testing
First Claim
1. A method of identifying locations for entry of probes into a test bed having a plurality of holes, the test bed having a surface of a first color layer and a second color layer bonded to and overcoating said first layer, comprising the steps of:
- overcoating the test bed surface with a second color securely bonded thereto; and
ablating a portion of said overcoated second color from said test bed adjacent selected apertures,so that at said selected apertures, the apertures are immediately identifiable by their color differential between said first and second colors.
3 Assignments
0 Petitions
Accused Products
Abstract
A circuit board tester that uses a dual-stage translation to bring a unit under test (UUT) into physical and electric contact first with a series of tall probes, then with a series of short probes. Initially, the UUT is mounted on a support plate, and spaced apart from both the tall and short probes. First, in order to perform a functional test on the UUT, a first vacuum stage is engaged, and atmospheric pressure translates the UUT longitudinally until contact is made with a first hard stop, defining a first position. At this first position, the UUT is in contact with a series of tall probes, and is spaced apart from a series of short probes. After a function test is performed, a second vacuum stage is engaged in addition to, and independent of, the first vacuum stage. Atmospheric pressure translates the UUT longitudinally until contact is made with a second hard stop, defining a second position.
6 Citations
9 Claims
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1. A method of identifying locations for entry of probes into a test bed having a plurality of holes, the test bed having a surface of a first color layer and a second color layer bonded to and overcoating said first layer, comprising the steps of:
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overcoating the test bed surface with a second color securely bonded thereto; and ablating a portion of said overcoated second color from said test bed adjacent selected apertures, so that at said selected apertures, the apertures are immediately identifiable by their color differential between said first and second colors. - View Dependent Claims (2, 3, 4)
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5. A method of identifying specific holes in an interface plate having one side of a predetermined color and first and second subsets of probe holes comprising:
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a) covering an area adjacent said first and second holes with an indicator; b) removing the indicator adjacent holes of said first subset;
so that holes of first and second subsets can be distinguished from each other by the differential between the color and the indicator. - View Dependent Claims (6, 7)
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8. A method of identifying specific holes in a probe plate have a surface of predetermined color and having first and second subsets of probe holes comprising:
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a) adhering an indicator adjacent said first and second subset holes; b) removing the indicator adjacent holes of said first subset; so that holes of first and second subsets can be distinguished from each other. - View Dependent Claims (9)
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Specification
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- Resources
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Current AssigneeCircuit Check
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Original AssigneeJon Hample, Neil Adams, Stuart Eickhoff
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InventorsAdams, Neil, Eickhoff, Stuart, Hample, Jon
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Granted Patent
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Time in Patent OfficeDays
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Field of Search
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US Class Current324/758
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CPC Class CodesG01R 31/2808 Holding, conveying or conta...Y10S 439/931 Conductive coating
